#BUTEL ARC 500 1.1 SOFTWARE#Optical metrology of a large deformable aspherical mirror using software configurable optical test system. Huang, R., Su, P., Horne, T., Brusa, G., & Burge, J.Diffractive optics calibrator: measurement of etching variations for binary computer-generated holograms. Cai, W., Zhou, P., Zhao, C., & Burge, J.Finally, whether it is used as a stand-alone or combined with phase-shifting, the binary patterns can, within seconds, calculate the slopes of any specular reflective surface. Furthermore, the binary pattern method can also be combined with a classic phase-shifting method to eliminate the need of a complex unwrapping algorithm and retrieve the absolute phase, especially in cases like segmented optics, where spatial algorithms have difficulties. The paper details the theory of this deflectometry method and the challenges of its implementation. Binary Pattern Deflectom-etry allows almost instant, simple, and accurate slope retrieval, which is required for applications using mobile devices. This paper presents a new deflectometry technique using binary patterns of increasing frequency to retrieve the surface slopes. Applied Optics, 53(5), 923-930.Ībstract: © 2014 Optical Society of America.Deflectometry is widely used to accurately calculate the slopes of any specular reflective surface, ranging from car bodies to nanometer-level mirrors. Instrument transfer function of slope measuring deflectometry systems. Su, T., Maldonado, A., Su, P., & Burge, J. Subaperture stitching tolerancing for annular ring geometry. Accurate and rapid IR metrology for the manufacture of freeform optics. High-accuracy aspheric x-ray mirror metrology using Software Configurable Optical Test System/deflectometry. Scholarly Contributions Journals/Publications
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